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Single rad hard power MOSFETs

Space-qualified high-reliability MOSFETs from 20 V to 650 V

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About

Rad hard MOSFET space and satellite applications

Infineon offers rad hard N-channel and P-channel MOSFETs for space power applications with mission lifetimes up to 15 years or longer. Available in single, dual, and quad, the portfolio suits various application needs such as:

  • Point-of-load (PoL) converters for FPGA, ASIC, and DSP core rails
  • Synchronous rectification
  • Active OR-ing circuits
  • Power distribution circuits, including redundant power
  • Load switching
  • Isolated DC-DC converters
  • Motor drives
  • Inrush current protection
  • Electric propulsion
  • Battery charging and battery management systems?
  • Thermal management
Rad hard MOSFETs and ICs selection guide
DLA quality conformance testing of IR HiRel-branded rad hard FETs

HiRel products, unlike standard commercial ones, must undergo quality conformance testing at various levels to ensure product performance to specifications in the rugged conditions typical in space and defense applications.?

In the United States, the Defense Logistics Agency (DLA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on semiconductor devices and hybrid modules, namely MIL-PRF-19500/MIL-STD-750, MIL-PRF-38534/MIL-STD-883, and MIL-PRF-38535/MIL-STD-883.

MIL-PRF-19500/MIL-STD-750 are the controlling specifications for discrete semiconductors such as diodes and power MOSFETs. MIL-PRF-19500 directs discrete semiconductors to be manufactured to either JAN, JANTX, JANTXV, or JANS levels.

HiRel quality
ESA quality conformance testing of Infineon-branded rad hard FETs

HiRel products, unlike standard commercial products, must be submitted to various levels of quality conformance testing to ensure that the products are capable of performing to specifications in the often-harsh environments of military and space applications.?

In Europe, the European Space Agency (ESA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on discrete semiconductor components, hermetically sealed, and die, namely ESCC-5000.

Infineon HiRel hermetic products are available as (1) commercial hermetic, designated (P) with the same fit, form and function as the flight parts and without radiation hardness or screening per Chart F3 in ESCC Generic Specification No. 5000, or (2) ESCC-5000 space-qualified for flight use. Such parts are denoted as (ES). Infineon-branded rad hard MOSFETs are also available as qualified bare die.

Radiation hardness assurance of Infineon rad hard MOSFETs

Infineon¡¯s rad hard MOSFETs are tested to verify their radiation hardness capability with an assurance program based on the requirements outlined in ESCC-5000, MIL-PRF-19500, and associated slash sheets. Our IR HiRel-branded products exceed the standard requirements with a sampling size up to two times greater than is required for every manufacturing lot. Both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions to provide a direct comparison. Radiation hardened by design techniques virtually eliminate the possibility of single-event gate rupture (SEGR) and single-event burnout (SEB) in the rad hard power MOSFETs. Robust performance is then verified through extensive SEE testing.

Rad hard MOSFET space and satellite applications

Infineon offers rad hard N-channel and P-channel MOSFETs for space power applications with mission lifetimes up to 15 years or longer. Available in single, dual, and quad, the portfolio suits various application needs such as:

  • Point-of-load (PoL) converters for FPGA, ASIC, and DSP core rails
  • Synchronous rectification
  • Active OR-ing circuits
  • Power distribution circuits, including redundant power
  • Load switching
  • Isolated DC-DC converters
  • Motor drives
  • Inrush current protection
  • Electric propulsion
  • Battery charging and battery management systems?
  • Thermal management
Rad hard MOSFETs and ICs selection guide

DLA quality conformance testing of IR HiRel-branded rad hard FETs

HiRel products, unlike standard commercial ones, must undergo quality conformance testing at various levels to ensure product performance to specifications in the rugged conditions typical in space and defense applications.?

In the United States, the Defense Logistics Agency (DLA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on semiconductor devices and hybrid modules, namely MIL-PRF-19500/MIL-STD-750, MIL-PRF-38534/MIL-STD-883, and MIL-PRF-38535/MIL-STD-883.

MIL-PRF-19500/MIL-STD-750 are the controlling specifications for discrete semiconductors such as diodes and power MOSFETs. MIL-PRF-19500 directs discrete semiconductors to be manufactured to either JAN, JANTX, JANTXV, or JANS levels.

HiRel quality

ESA quality conformance testing of Infineon-branded rad hard FETs

HiRel products, unlike standard commercial products, must be submitted to various levels of quality conformance testing to ensure that the products are capable of performing to specifications in the often-harsh environments of military and space applications.?

In Europe, the European Space Agency (ESA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on discrete semiconductor components, hermetically sealed, and die, namely ESCC-5000.

Infineon HiRel hermetic products are available as (1) commercial hermetic, designated (P) with the same fit, form and function as the flight parts and without radiation hardness or screening per Chart F3 in ESCC Generic Specification No. 5000, or (2) ESCC-5000 space-qualified for flight use. Such parts are denoted as (ES). Infineon-branded rad hard MOSFETs are also available as qualified bare die.

Radiation hardness assurance of Infineon rad hard MOSFETs

Infineon¡¯s rad hard MOSFETs are tested to verify their radiation hardness capability with an assurance program based on the requirements outlined in ESCC-5000, MIL-PRF-19500, and associated slash sheets. Our IR HiRel-branded products exceed the standard requirements with a sampling size up to two times greater than is required for every manufacturing lot. Both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions to provide a direct comparison. Radiation hardened by design techniques virtually eliminate the possibility of single-event gate rupture (SEGR) and single-event burnout (SEB) in the rad hard power MOSFETs. Robust performance is then verified through extensive SEE testing.

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